J. Nick Koston a1ab19d127 [ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)

2025-11-12 21:56:11 -05:00

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common.h

C++ components unit test framework (#9284)

2025-10-21 22:21:22 +00:00

test-uart_max_with_usb_cdc.esp32-s2-idf.yaml

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test-uart_max_with_usb_serial_jtag.esp32-c3-idf.yaml

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test.esp32-c3-idf.yaml

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test.esp32-idf.yaml

Expand uart.write tests (#11785)

2025-11-10 11:09:03 +13:00

test.esp8266-ard.yaml

Add additional uart test coverage (#11571)

2025-10-29 08:03:09 +13:00

test.host.yaml

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test.rp2040-ard.yaml

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uart_component.cpp

C++ components unit test framework (#9284)

2025-10-21 22:21:22 +00:00

uart_device.cpp

C++ components unit test framework (#9284)

2025-10-21 22:21:22 +00:00